9030.82.0000
美国For measuring or checking semiconductor wafers or devices (including integrated circuits)
原文（English）：For measuring or checking semiconductor wafers or devices (including integrated circuits)
税率信息
Column 1 General
Free
Special（FTA 优惠）
无数据
Column 2
40%
计量单位
第一法定单位
--
第二法定单位
--
同品目相关编码
| HS 编码 | 产品名称 |
|---|---|
| 9030.10.0000 | Instruments and apparatus for measuring or detecting ionizing radiations |
| 9030.20.0500 | Specially designed for telecommunications |
| 9030.20.1000 | Other oscilloscopes and oscillographs |
| 9030.31.0000 | Multimeters, without a recording device |
| 9030.32.0000 | Multimeters, with a recording device |
| 9030.33.3400 | Resistance measuring instruments |
| 9030.33.3800 | Other |
| 9030.39.0100 | Other, with a recording device |
| 9030.40.0000 | Other instruments and apparatus, specially designed for telecommunications (for example, cross-talk meters, gain measuring instruments, distortion factor meters, psophometers) |
| 9030.84.0000 | Other, with a recording device |
| 9030.89.0100 | Other |
| 9030.90.2500 | Printed circuit assemblies |
| 9030.90.4600 | Other |
| 9030.90.6600 | Of instruments and apparatus of subheading 9030.40 or 9030.82 |
| 9030.90.6800 | Other |
| 9030.90.8400 | Of instruments and apparatus of subheading 9030.82 |
| 9030.90.8911 | Of articles of subheading 9030.20 |
| 9030.90.8921 | Of articles of subheading 9030.31 |
| 9030.90.8922 | Of articles of subheading 9030.32 |
| 9030.90.8923 | Of articles of subheading 9030.33 |
| 9030.90.8931 | Of articles of subheading 9030.39 |
| 9030.90.8940 | Of articles of subheading 9030.40 |
| 9030.90.8956 | Of articles of subheading 9030.84 |
| 9030.90.8961 | Other |
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数据来源于 USITC HTSUS 公开数据，仅供参考，实际以 USITC 与 CBP 最新发布为准。