9031.90.4500
USABases and frames for the coordinate-measuring machines of subheading 9031.49.40
Original (Englisch)：Bases and frames for the coordinate-measuring machines of subheading 9031.49.40
Zollinformationen
Column 1 General
Free
Special (FTA-Präferenz)
Keine Daten
Column 2
50%
Maßeinheiten
Primäre Einheit
--
Sekundäre Einheit
--
Verwandte Codes (gleiche Position)
| Zolltarifnummer | Produktname |
|---|---|
| 9031.10.0000 | Machines for balancing mechanical parts |
| 9031.20.0000 | Test benches |
| 9031.41.0020 | For inspecting photomasks or reticles used in manufacturing semiconductor devices |
| 9031.41.0040 | For wafers |
| 9031.41.0060 | Other |
| 9031.49.1000 | Profile projectors |
| 9031.49.4000 | Coordinate-measuring machines |
| 9031.49.7000 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices |
| 9031.49.9000 | Other |
| 9031.80.4000 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles |
| 9031.80.8060 | For testing electrical characteristics |
| 9031.80.8070 | Other |
| 9031.80.8085 | Other |
| 9031.90.2100 | Of profile projectors |
| 9031.90.5400 | Of optical instruments and appliances of subheading 9031.41 or 9031.49.70 |
| 9031.90.5900 | Other |
| 9031.90.7000 | Of articles of subheading 9031.80.40 |
| 9031.90.9130 | Of machines for balancing mechanical parts |
| 9031.90.9160 | Of test benches |
| 9031.90.9195 | Other |
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